ZHCSHU6L march   2018  – august 2023 BQ77915

PRODUCTION DATA  

1.   1
2. 1 特性
3. 2 應(yīng)用
4. 3 說(shuō)明
5. 4 Revision History
6. 5 說(shuō)明（續(xù)）
7. 6 Device Comparison Table
8. 7 Pin Configuration and Functions
9. 8 Specifications
   1. 8.1 Absolute Maximum Ratings
   2. 8.2 ESD Ratings
   3. 8.3 Recommended Operating Conditions
   4. 8.4 Thermal Information
   5. 8.5 Electrical Characteristics
   6. 8.6 Typical Characteristics
10. 9 Detailed Description
    1. 9.1 Overview
       1. 9.1.1 Device Functionality Summary
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
       1. 9.3.1  Protection Summary
       2. 9.3.2  Fault Operation
          1. 9.3.2.1  Operation in OV
          2. 9.3.2.2  Operation in UV
          3. 9.3.2.3  Operation in OW
          4. 9.3.2.4  Operation in OCD1
          5. 9.3.2.5  Operation in OCD2
          6. 9.3.2.6  Programming the OCD1/2 Delay Using the OCDP Pin
          7. 9.3.2.7  Operation in SCD
          8. 9.3.2.8  Operation in OCC
          9. 9.3.2.9  Overcurrent Recovery Timer
          10. 9.3.2.10 Load Detection and Load Removal Detection
          11. 9.3.2.11 Operation in OTC
          12. 9.3.2.12 Operation in OTD
          13. 9.3.2.13 Operation in UTC
          14. 9.3.2.14 Operation in UTD
       3. 9.3.3  Protection Response and Recovery Summary
       4. 9.3.4  Cell Balancing
       5. 9.3.5  HIBERNATE Mode Operation
       6. 9.3.6  Configuration CRC Check and Comparator Built-In-Self-Test
       7. 9.3.7  Fault Detection Method
          1. 9.3.7.1 Filtered Fault Detection
       8. 9.3.8  State Comparator
       9. 9.3.9  DSG FET Driver Operation
       10. 9.3.10 CHG FET Driver Operation
       11. 9.3.11 External Override of CHG and DSG Drivers
       12. 9.3.12 Configuring 3-Series, 4-Series, or 5-Series Modes
       13. 9.3.13 Stacking Implementations
       14. 9.3.14 Zero-Volt Battery Charging Inhibition
    4. 9.4 Device Functional Modes
       1. 9.4.1 Power Modes
          1. 9.4.1.1 Power On Reset (POR)
          2. 9.4.1.2 NORMAL Mode
          3. 9.4.1.3 FAULT Mode
          4. 9.4.1.4 HIBERNATE Mode
          5. 9.4.1.5 SHUTDOWN Mode
          6. 9.4.1.6 Customer Fast Production Test Modes
11. 10Application and Implementation
    1. 10.1 Application Information
       1. 10.1.1 Recommended System Implementation
          1. 10.1.1.1 CHG and DSG FET Rise and Fall Time
          2. 10.1.1.2 Protecting CHG and LD
          3. 10.1.1.3 Protecting the CHG FET
          4. 10.1.1.4 Using Load Detect for UV Fault Recovery
          5. 10.1.1.5 Temperature Protection
          6. 10.1.1.6 Adding RC Filters to the Sense Resistor
          7. 10.1.1.7 Using the State Comparator in an Application
             1. 10.1.1.7.1 Examples
    2. 10.2 Typical Application
       1. 10.2.1 Design Requirements
       2. 10.2.2 Detailed Design Procedure
          1. 10.2.2.1 Design Example
       3. 10.2.3 Application Curves
12. 11Power Supply Recommendations
13. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
14. 13Device and Documentation Support
    1. 13.1 第三方產(chǎn)品免責(zé)聲明
    2. 13.2 Documentation Support
       1. 13.2.1 Related Documentation
    3. 13.3 接收文檔更新通知
    4. 13.4 支持資源
    5. 13.5 Trademarks
    6. 13.6 靜電放電警告
    7. 13.7 術(shù)語(yǔ)表
15. 14Mechanical, Packaging, and Orderable Information