6 Summary

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance and single-event transients (SET) performance of the TMUX582F-SEP, latch-up immune 8:1 multiplexer with adjustable fault thresholds. Heavy-ions with an LET_EFF of 43MeV-cm²/ mg were used for the SEE characterization. The SEE results demonstrated that the TMUX582F-SEP is SEL-free up to LET_EFF = 43MeV × cm² / mg and across the full electrical specifications. Transients at LET_EFF = 43MeV × cm² / mg on VOUT are presented and discussed. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE are presented for reference.